JPH0755445Y2 - 走査型トンネル顕微鏡の探針 - Google Patents

走査型トンネル顕微鏡の探針

Info

Publication number
JPH0755445Y2
JPH0755445Y2 JP1989109657U JP10965789U JPH0755445Y2 JP H0755445 Y2 JPH0755445 Y2 JP H0755445Y2 JP 1989109657 U JP1989109657 U JP 1989109657U JP 10965789 U JP10965789 U JP 10965789U JP H0755445 Y2 JPH0755445 Y2 JP H0755445Y2
Authority
JP
Japan
Prior art keywords
probe
tip
scanning tunneling
tunneling microscope
diamond
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989109657U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0348702U (en]
Inventor
礼三 金子
重光 小口
久作 菅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Adamant Co Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Adamant Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Adamant Kogyo Co Ltd filed Critical Nippon Telegraph and Telephone Corp
Priority to JP1989109657U priority Critical patent/JPH0755445Y2/ja
Publication of JPH0348702U publication Critical patent/JPH0348702U/ja
Application granted granted Critical
Publication of JPH0755445Y2 publication Critical patent/JPH0755445Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP1989109657U 1989-09-21 1989-09-21 走査型トンネル顕微鏡の探針 Expired - Lifetime JPH0755445Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989109657U JPH0755445Y2 (ja) 1989-09-21 1989-09-21 走査型トンネル顕微鏡の探針

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989109657U JPH0755445Y2 (ja) 1989-09-21 1989-09-21 走査型トンネル顕微鏡の探針

Publications (2)

Publication Number Publication Date
JPH0348702U JPH0348702U (en]) 1991-05-10
JPH0755445Y2 true JPH0755445Y2 (ja) 1995-12-20

Family

ID=31658233

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989109657U Expired - Lifetime JPH0755445Y2 (ja) 1989-09-21 1989-09-21 走査型トンネル顕微鏡の探針

Country Status (1)

Country Link
JP (1) JPH0755445Y2 (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005331184A (ja) * 2004-05-20 2005-12-02 Kuken Kogyo Co Ltd 空調吹出口ユニット
JP5081606B2 (ja) * 2007-12-19 2012-11-28 三洋電機株式会社 吹出ユニット、およびこれを用いた空気調和システム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2565336B2 (ja) * 1987-05-06 1996-12-18 セイコー電子工業株式会社 走査型トンネル顕微鏡

Also Published As

Publication number Publication date
JPH0348702U (en]) 1991-05-10

Similar Documents

Publication Publication Date Title
US6546788B2 (en) Nanotomography
US7497613B2 (en) Probe with embedded heater for nanoscale analysis
Castle et al. Characterization of surface topography by SEM and SFM: problems and solutions
De Wolf et al. One‐and two‐dimensional carrier profiling in semiconductors by nanospreading resistance profiling
Trenkler et al. Evaluating probes for “electrical” atomic force microscopy
EP0619872A1 (en) PIEZORESISTIVE BENDING ELEMENT FOR NUCLEAR FORCE MICROSCOPY.
Olbrich et al. High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy
US6884999B1 (en) Use of scanning probe microscope for defect detection and repair
JPH01262403A (ja) プローブおよびその製造方法
US6566650B1 (en) Incorporation of dielectric layer onto SThM tips for direct thermal analysis
Thomson et al. Development of highly conductive cantilevers for atomic force microscopy point contact measurements
Dobson et al. Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces
JPH0755445Y2 (ja) 走査型トンネル顕微鏡の探針
Rettenberger et al. Variation of the thermovoltage across a vacuum tunneling barrier: Copper islands on Ag (111)
JP3317001B2 (ja) プローブ製造方法
JP3240309B2 (ja) 原子間力顕微鏡用プローバ及び原子間力顕微鏡
Olbrich et al. A new AFM-based tool for testing dielectric quality and reliability on a nanometer scale
van Helleputte et al. Comparative study of 3D measurement techniques (SPM, SEM, TEM) for submicron structures
Skolaut Molecular Motor Based on Single Chiral Tripodal Molecules Studied with STM
JPH08285867A (ja) 探針、カンチレバー及びこれ等を具備する力顕微鏡
JPH0658754A (ja) 探針形状測定方法
Linholm et al. Measurement of patterned film linewidth for interconnect characterization
Sch et al. Development of a combined AFM‐tribometer test rig
JPH11304822A (ja) 走査型プローブ顕微鏡の標準サンプルおよびその製造方法
Pieralli et al. New optical probe using ZnO whiskers: Analyses. of sub-wavelength dithering and evanescent wave propagation.